Books & Book Chapters

 

·         Niraj Jha and Sandip Kundu, “Testing and Reliable Design of CMOS Circuits,” ISBN 0-7923-9056-3, TK7871.99.M44J49, Kluwer Academic Publishers, Boston, MA, 1990

·         Sudhakar Reddy and Sandip Kundu, “Fault Detection and Design for Testability of CMOS Logic Circuits,” Chapter in “Testing and Diagnosis of VLSI and ULSI” Edited by F. Lombardi and M. G. Sami(Eds), pp. 69-92, Kluwer Academic Publishers, Boston, MA, 1988

·         Sandip Kundu and Alodeep Sanyal, Introduction Chapter in “Power-Aware Testing and Test Strategies for Low Power Devices,” Edited by Patrick Girard, Nicola Nicolici, Xiaoqing Wen, ISBN: 978-1-4419-0927-5, Springer, 2009

·         Sandip Kundu and Aswin Sreedhar, "Nanoscale CMOS VLSI Circuits: Design for Manufacturability," ISBN: 978-0071635196, McGraw-Hill Professional, 2010