Call For Papers
IEEE 10th North Atlantic Test Workshop 2001

May 24-25, 2001
Ocean View Inn & Resort
Gloucester, Massachusetts, USA



General Chair
Xinghao Chen -- IBM

Program Chair
Ian G. Harris -- UMass Amherst

Finance and Registration
E. S. Cooley -- Dartmouth Coll.

Local Arrangements Chair
Karen Panetta -- Tufts Univ.

Publicity Chair
S. Upadhyaya -- SUNY-Buffalo

Past Chairs
Jien-Chung Lo -- Univ. R.I.
James Monzel -- IBM
Jake Karrfalt -- ASC Inc.

Program Committee
D. Adams -- IBM
V. D. Agrawal -- Lucent
J. Armstrong -- Virginia Tech.
C. Baron -- INSAT
M. Bushnell -- Rutgers Univ.
J. Braden -- Sun Microsys.
K. Chakrabarty -- Duke Univ.
T. Chakraborty -- Lucent
S. Chakradhar -- NEC
P. Chang -- Intel
R. Davies -- Compaq
R. Hart -- Step Tech Inc.
M. Hsiao -- Rutgers Univ.
N. K. Jha -- Princeton Univ.
P. K. Lala -- Univ. S. Florida
F. Lombardi -- Northeastern U.
Y. Ma -- Advantest America
D. Mukherjee -- Intel
P. Nigh -- IBM
H. Nguyen -- MIT Lincoln Lab
J. Savir -- NJIT
J. Schoenfeld -- Sun Microsys.
K. Shepard -- Columbia Univ.
P. Song -- IBM
C. Stolicny -- Compaq
J. de Sousa -- Lucent
S. Y. Su -- SUNY Binghampton
J. Tellier -- QSC Audio
S. Wu -- Lucent
Y. Wu -- Nortel Networks
T. Ziaja -- IBM


The printable pdf version of the call for papers.

The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient testing methodologies and designs. The 10th workshop will feature "Managing Massive Design and Test Complexities". The major topics include, but are not limited to, the following:
  • Analog Circuit Testing
  • Automatic Test Generation
  • Built-In Self-Test (BIST)
  • Card/Board Testing
  • Delay Testing
  • Design for Testability
  • Design Verification/Validation
  • Economics of Test
  • Embedded Core Testing
  • Fault Modeling and Diagnosis
  • Fault Simulation
  • Hardware/Software Testing
  • Hierarchical Test Generation
  • High Frequency Test
  • IDDQ Testing
  • MCM Testing
  • Mixed Signal Test
  • System Reliability
  • Online Testing
  • System Testing

The Program Committee invites authors to submit original, unpublished paper and panel proposals. Papers may be extended summaries of full papers. Detailed instructions for submission can be found at the AUTHOR/REVIEWER link at the NATW'01 web page.

Session on HDL Applications in Test:
Session Organizer: Zainalabedin Navabi -- Northeastern U.

Features of HDLs such as handling of concurrency, data representation, and simulatability features fit well for implementation of test methodologies, testability analysis, test data representation, test database standardization, and test architecture design. A session is dedicated to explore these and other HDL applications in test.


Important Dates:
Submission of papers - 2/02/01
Notification of paper acceptance - 3/16/01
Submission of camera-ready papers - 4/16/01


For general information, contact:
Dr. Xinghao Chen, General Chair
IBM, V43G-256-2
1701 North Street
Endicott, N.Y. 13760
Phone: 607-755-9713
FAX: 607-755-5608
Email: xinghaoc@vnet.ibm.com 		Submit paper proposals to:
Dr. Ian G. Harris, Program Chair
Dept. Electrical and Comp. Eng.
University of Massachusetts
Knowles Engineering Bldg. 309J
Amherst, MA 01003
Phone: 413-545-1594
FAX: 413-545-4611
Email: harris@ecs.umass.edu

For more information regarding this workshop, visit our homepage at

http://www.ecs.umass.edu/natw

The 2001 North Atlantic Test Workshop is sponsored by the IEEE Computer Society , Test Technology Technical Council and the University of Massachusetts Amherst.