Call For Papers
IEEE 12th North Atlantic Test Workshop 2003

May 15-16, 2003
Guerney's Inn at the Sea
Montauk, New York, USA



General Chair
Ian G. Harris -- UMass Amherst

Vice General Chair
Michael Bushnell -- Rutgers U.

Program Chair
Peilin Song -- IBM

Vice Program Chair
S. Upadhyaya -- SUNY - Buffalo

Local Arrangements
Vishwani D. Agrawal -- Agere

Registration
E. S. Cooley -- Dartmouth Coll.

Publicity
Shawn Blanton -- CMU

Audio/Visual
K. Chakrabarty - Duke Univ.

Program Committee
D. Adams -- PDAT Technologies
S. Chakradhar -- NEC
P. Chang -- IBM
R. Davies -- HP
R. Hart -- Step Tech Inc.
M. Hsiao -- Virginia Tech.
V. Iyengar -- IBM
N. K. Jha -- Princeton Univ.
R. Karri -- Polytechnic U.
P. K. Lala -- Univ. Arkansas
F. Lombardi -- Northeastern U.
Y. Ma -- Advantest America
Y. Makris -- Yale
M. Margala -- Univ. Rochester
S. Mitra -- Intel
Z. Navabi -- Northeastern U.
P. Nigh -- IBM
H. Nguyen -- MIT Lincoln Lab
S. Ozev -- Duke Univ.
J. Savir -- NJIT
K. Shepard -- Columbia Univ.
J. de Sousa -- Tech. U. Lisbon
C. Stolicny -- Intel
P. Thaker -- Zagros Networks
R. Tekumalla -- Sun Microsys.
J. Tellier -- QSC Audio
S. Wu -- SynTest Tech.
Y. Wu -- Nortel
T. Ziaja -- Sun Microsys.

Steering Committee
Xinghao Chen -- CCNY
Jake Karrfalt -- ASC Inc.
Jien-Chung Lo -- Univ. R.I.
James Monzel -- IBM
Karen Panetta -- Tufts Univ.


The printable pdf version of the call for papers.

The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient testing methodologies and designs. The 12th workshop will feature "Test Challeges for the Deep Sub-Micron Era". The major topics include, but are not limited to, the following:
  • Analog/Mixed Circuit Testing
  • Automatic Test Generation
  • Built-In Self-Test (BIST)
  • Board Level Testing
  • Defect Oriented Testing
  • Delay/Performance Testing
  • Design for Testability
  • Design Verification/Validation
  • Diagnosis and Debug
  • Embedded Core Testing
  • Fault Modeling/Simulation
  • IDDQ Testing
  • Multi-Chip Module Testing
  • Memory Testing
  • MEMS Testing
  • Online Testing
  • System-on-Chip (SOC) Test
  • System Testing
  • Test Economics
  • Test Quality/System Reliability
  • Test Resource Partitioning
  • Test Synthesis

The Program Committee invites authors to submit original, unpublished paper and panel proposals. Papers may be extended summaries of full papers. Detailed instructions for submission can be found at the AUTHOR/REVIEWER link at the NATW'03 web page.

Best Student Presentation Award:

To encourage student participation in the research community, we will have sessions dedicated to student presentations and present a Best Student Presentation Award. We feel that it is important to integrate students into the research community early in their careers so that they can experience the excitement of direct interaction with their peers.


Important Dates:
Submission of papers - 2/07/03
Notification of paper acceptance - 3/21/03
Submission of camera-ready papers - 4/18/03


For general information, contact:
Dr. Ian G. Harris, General Chair
Dept. Electrical and Comp. Eng.
University of Massachusetts
Knowles Engineering Bldg. 309J
Amherst, MA 01003
Phone: 413-545-1594
FAX: 413-545-1993
Email: harris@ecs.umass.edu 		Submit paper proposals to:
Dr. Peilin Song, Program Chair
IBM T. J. Watson Research Center
1101 Kithawan Road, Route 134
Yorktown Heights, NY 10598
Phone: 914-945-3990
FAX: 914-945-4329
Email: psong@us.ibm.com

For more information regarding this workshop, visit our homepage at

http://www.ecs.umass.edu/natw

The 2003 North Atlantic Test Workshop is sponsored by the Rutgers University , Test Technology Technical Council and the University of Massachusetts Amherst.