IEEE 12th North Atlantic Test Workshop
NATW'03

May 15-16, 2003
Gurney's Inn at the Sea
Montauk, New York, USA




The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to higher quality, more economical, and more efficient testing methodologies and designs. The 12th workshop will focus on "Test Challenges for the Deep Sub-Micron Era". The 2003 workshop will be held at Guerney's Inn at the Sea, Montauk, NY, located on Long Island.

  • This year we wish to encourage student participation by offering a Best Student Paper Award .

    For general information, contact:
    Dr. Ian G. Harris, General Chair
    Dept. Electrical and Comp. Engineering
    University of Massachusetts
    Knowles Engineering Bldg. 309J
    Amherst, MA 01003
    Phone: 413-545-1594
    FAX: 413-545-1993
    Email: harris@ecs.umass.edu     		Submit paper proposals to:
    Dr. Peilin Song, Program Chair
    IBM T. J. Watson Research Center
    1101 Kithawan Road, Route 134
    Yorktown Heights, N.Y. 10598
    Phone: 914-945-3990
    FAX: 914-945-4329
    Email: psong@us.ibm.com
    Sponsored by the Rutgers University , the IEEE Test Technology Technical Council and University of Massachusetts Amherst.