Dr. Joseph Goldstein, Distinguished Professor
 313 ELab
University of Massachusetts
160 Governors Drive
Amherst, MA 01003-2210
E-mail: jig0@ecs.umass.edu
Phone: (413) 545-2165
Fax: (413) 545-1027
Education:
B.S., Massachusetts Institute of Technology, 1960;
S.M., Massachusetts Institute of Technology, 1962;
Sc.D., Massachusetts Institute of Technology, 1964
Research Interests: Electron probe microanalyzer,
scanning electron microscope, and analytical electron microscope for
application to problems in materials science and engineering
Honors & Awards:
- Recipient of the 1999 Henry Clifton Sorby Award of the International Metallographic Society
- Fellow of the American Society of Metals
Select Archival Publications:
- "Future Directions of X-ray Microanalysis in the Analytical
Electron Microscope," J. I. Goldstein, Proceedings 5th Asia-Pacific
Electron Microscopy Conference, Beijing, China, ed. K. H. Kuo and Z. H.
Zhai, World Scientific Publishing, Singapore, China, 138-141 (1992).
- "Definition
of the Spatial Resolution of X-ray Microanalysis in Thin Foils," D. B.
Williams, J. R. Michael, J. I. Goldstein, and A. D. Romig, Jr.,
Ultramicroscopy, 47, 121-132 (1992).
- "The Application of
High-Resolution SEM and EPMA to the Study of Coatings and Interfaces of
Materials," J. I. Goldstein, Proceedings 51st Annual Meeting Microscopy
Society of America, ed. G. W. Bailey and C. L. Rieder, San Francisco
Press, San Francisco, CA., 848-849 (1993).
- "The Influence
of Oxide Surface Layers on Bulk Electron Probe Microanalysis of
Oxygen-Application to Ti-Si-O Compounds," J. I. Goldstein, S. K. Choi,
F. J. J. van Loo, H. J. M. Heijligers, G. F. Bastin, and W. G. Sloof,
Scanning, Vol. 15, 165-170 (1993).
- "The microstructure and
formation of duplex and black plessite in iron meteorites," J. Zhang,
D.B. Williams, and J. I. Goldstein, Geochimica et Cosmochimica Acta,
Vol. 57, 3725-3735 (1993).
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