Researchers of the VLSI Yield and Reliability Group

Principal Investigator

• Israel Koren (koren@ecs.umass.edu)

Students

• Rajnish Prasad (rprasad@ecs.umass.edu)
• Mandeep Singh (msingh@ecs.umass.edu)
• Ravinder Rachala (rrachala@ecs.umass.edu)
• Zhaojun Wo (zwo@ecs.umass.edu)

Alumni

• Venkat K. R. Chiluvuri, Intel
• Zhan Chen, Intel
• Vergis Mathew, Compaq
• Arun Venkataraman, IBM

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