1995 Best Paper Award

The IEEE Transactions on Semiconductor Manufacturing

The award was announced in the August 1996 Issue of these Transactions, p. 293

----------------------------

Best Paper Award

The IEEE Transactions on Semiconductor Manufacturing Best Paper Award is presented to the authors of that paper considered by the Transactions' Editorial Staff and reviewers to be the outstanding paper published during the year. The award is based on the accuracy, originality, and importance of the technical concept, as well as the quality and readability of the manuscript. The Best Paper Award is also based on the immediate or potential impact that this work will have on the overall semiconductor manufacturing industry.

The IEEE Transactions on Semiconductor Manufacturing Best Paper Award, presented at the annual Advanced Semiconductor Manufacturing Conference and workshop, recognizes the on-going partnership of this conference and IEEE.

The Editorial Staff is pleased to announce that the paper entitled "Layout Synthesis Techniques for Yield Enhancement," by V.K.R. Chiluvuri and I. Koren, has been recognized as the best paper published in the 1995 Transactions. This paper, which appeared in the May issue, has been chosen because it presents a novel method to apply yield enhancement techniques at a high level of design abstraction. The techniques discussed enable the IC to be desensitized to point defect related yield loss without increasing the die area during the layout synthesis phase of the IC development. The techniques described in this paper have been used in a commercially available CAD framework.

For the complete manuscript in (compressed) PostScript format click here

Return to the Yield Research page