Important Dates/Deadlines

Papers May 27 June 10, 2011
Special Session proposals June 3 June 17, 2011
Tutorial proposals June 3 June 17, 2011
Exhibition/Booth proposals May 27 June 10, 2011
Notification of acceptance August 1 August 15, 2011
Camera-ready paper due date August 22 September 5 September 20, 2011

Author Guidelines

Paper Presentation Template

Please use the following template for presentation of your paper.

Paper Submission Instruction

The following is a URL link to the "Author's Final Paper Formatting and Submission Instructions" Webpage (Online Author Kit) for 2011 Asian Test Symposium (ATS 2011): Author Kit

Please note: The Author Kit's PDF eXpress service will not be available immediately. The PDF eXpress service will be available on or after Tuesday, 30 August 2011 and that the paper submission deadline has been extended to Tuesday, 20 September 2011.

Paper Formatting Instructions

Please format your paper using the IEEE Conference style in US letter size. Templates are provided below. Make sure that page numbers are removed. The nominal page limit is 6. Up to 4 additional pages can be purchased at $100/page. The excess page charges need to be paid during the registration process.

    Microsoft Word Template
    If you are using Microsoft Word, please use this template.

    Latex Templates
    If you are using latex, you can use the templates from here.

NOTE: Blind review is optional.

Electronic Submission

The paper submission process uses EasyChair conference manager. Papers should be submitted in PDF format. Please click on the EasyChair link to access the submission system.

Paper acknowledgments will be sent to all authors.

IEEE Copyright Form
All authors must complete copyright transfer in order to have their papers included in the ATS program. All clearances for publication must be obtained by the authors. Instructions for copyright transfer will be sent to authors of accepted papers.

Paper Topics

Choose from one of the following categories:

Automatic Test Pattern Generation (ATPG) Boundary Scan
Test Compression Online Test
Temperature/Power-aware Test Design-for-testability (DFT)
Microprocessor Test Mixed signal and Analog Test
Memory Test System-in-package (SiP)/ 3D Test
Test Quality and Reliability Design Validation/Silicon Debug
Fault Modeling/Defect Based Test Fault Simulation/Diagnosis
Software Testing Board and System Test
Innovative Industrial Test Practices* Other

* In above list of categories, ATS 2011 has introduced a new category for technical papers to solicit original contributions that showcase Innovative Industrial Test Practices. Submissions could be related to silicon test data studies, new/novel test EDA tool user experiences, or case studies. Submission requirements and review guidelines for these papers are the same as regular technical papers.

Special Sessions


Please see separate deadlines. All special session submissions are also handled using the EasyChair system. Please choose from one of the following categories. For, industrial test practices paper guidelines is as above. Proposals related to panels/special sessions, embedded tutorials, and full/half day tutorials are limited to 3 pages, and should detail abstract and bulleted list of topics, targeted audience, proposed duration, organizer's name and affiliation, speakers' names, affiliations, short bios, and approval status for participation at ATS 2011.

Special Session Proposal Embedded Tutorial Proposal
Full/Half Day Tutorial Proposal