The ATS 20th anniversary compendium of selected papers celebrates the 20th anniversary of the Asian Test Symposium. This collection of papers have been chosen by the selection committee to represent the best contributions among those presented in ATS in past 10 years, based on their impact in the field of testing.

The ATS compendiums of selected papers remind the audiences of the tremendous progress that has been made in the field of testing in the past twenty years. This progress mirrors the rise of semiconductor research in Asia.

The ATS 20th anniversary compendium of selected papers charts the 2nd decade of progress in test research and is an invaluable guide for researchers, students and practitioners alike.

Previously, the ATS 10th anniversary compendium of selected papers was published in 2001 to mark the first decade of progress in test research.

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